Visual Modeling

Utilizes digital twin technology to create digital models of test system hardware and software, enabling quick setup and adjustment of device parameters and connection methods.

Graphical Programming

Code-free test sequence creation using a drag-and-drop interface, allowing flexible development of customized projects.

Real-time Debugging & Verification

Enables visual modification, debugging, and execution during the test setup phase, facilitating rapid iteration, optimization, and accelerating the test development process.

Visual Component Library

Provides a rich library of visual components for easily customizing personalized test display interfaces.

Report Customization

Automatically generates test data reports and supports flexible format and content configuration to meet diverse requirements.

Process Monitoring

Clear overview of test sequence execution flow, enabling precise control over test progress.

Device Monitoring

Real-time monitoring of the device under test status and command execution to ensure testing accuracy.

Runtime Visualization

Test run data displayed in charts and graphs for intuitive presentation of results.

Supports historical record query and replay for rapid problem identification.

Intelligent Plan Configuration

Flexible setup of test task sequence, iterations, and parameters.

Batch Testing

Supports automated batch processing and multi-device parallel testing, significantly improving efficiency.

Data Storage & Analysis

All test records automatically saved to a database for subsequent querying and in-depth analysis.

Supports Requirement Changes

Accommodates various test requirement changes and process optimizations without complex secondary development.

Supports Function Extension

Provides flexible expansion mechanisms for devices and functional modules to meet diverse testing scenario needs.

Supports Plugins & Scripts

Supports external plugins and scripting languages (C#, Python) for development, meeting user-specific customization requirements.

All-Star Complex Electromagnetic Environment Test System

Traditional Single-Antenna Large Anechoic Chamber Test System

Wired Test System

Skyward Wireless Test System

Small Chamber Batch Inspection Test System

RDSS Satellite Navigation Test

General/Precision OEM Board Test

RNSS Satellite Navigation Test

Multi-frequency High-Precision OEM Board Test

Satellite Navigation Auxiliary Capability Test

Beidou Anti-jamming Component Test

Power Supply Related Capability Test

Beidou Anti-jamming Receiver Test

Multi-mode Navigation Baseband Chip Test

Mobile Network Operator Base Station Test

Network Registration Test

Network Access Permit Test

Beidou-3 Baseband Chip Comparison & Appraisal Test

Satellite Internet Navigation Terminal Test

Other test items can be openly and rapidly constructed